Phase-sensitive Bloch surface wave sensor based on variable angle spectroscopic ellipsometry

Optics Express

Volumn 22, Issue 18, 2014, Pages 21403-21410

  Li, Yanhui ^a,b   Yang, Tianlin ^a   Pang, Zhiyong ^a,b   Du, Guiqiang ^a   Song, Shumei ^a   Han, Shenghao ^a,b  

^a SHANDONG UNIVERSITY   (China)

^b SHANDONG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

REFLECTION; SIGNAL DETECTION; SPECTROSCOPIC ELLIPSOMETRY;

DIELECTRIC LAYER; INTENSITY DETECTION; LOWER LIMIT OF DETECTIONS; PHASE DETECTION; PHASE SENSITIVE; REFLECTION PHASE; SENSING APPLICATIONS; VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY;

SURFACE WAVES;

EID: 84907291828     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.22.021403     Document Type: Article

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