SCOPUS 정보 검색 플랫폼

IOP Conference Series: Materials Science and Engineering

Volumn 8, Issue 1, 2010, Pages

Detection of heterogeneities in single-crystal CaCu3Ti 4O12 using conductive atomic force microscopy

(10) Fiorenza, Patrick a Lo Nigro, Raffaella a Raineri, Vito a Krohns, Stephan b Lunkenheimer, Peter b Loidl, Alois b Ebbinghaus, Stefan G c Ferrarelli, Matthew C d Sinclair, Derek C d West, Anthony R d

a CNR (Italy)

b UNIVERSITY OF AUGSBURG (Germany)

c MARTIN LUTHER UNIVERSITY HALLE WITTENBERG (Germany)

d UNIVERSITY OF SHEFFIELD (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIELECTRIC PROPERTIES; ELECTRIC NETWORK ANALYSIS; OXIDE FILMS; SCANNING ELECTRON MICROSCOPY; THIN FILMS;

AFM; CONDUCTIVE ATOMIC FORCE MICROSCOPY; ELECTRICAL CHARACTERIZATION; ELECTRICAL HOMOGENEITY; IMPEDANCE SPECTROSCOPY; MACROSCOPIC MEASUREMENTS; MATRIX; SECONDARY PHASE;

SINGLE CRYSTALS;

EID: 84906546607 PISSN: 17578981 EISSN: 1757899X Source Type: Conference Proceeding
DOI: 10.1088/1757-899X/8/1/012018 Document Type: Conference Paper

Times cited : (2)

References (12)

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- Fiorenza P, Lo Nigro R, Sciuto S, Delugas P, Raineri V, Toro R G, Catalano M R, Malandrino G; 2009 J. Appl. Phys., 105, 061634
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- Fiorenza, P.¹ Lo Nigro, R.² Sciuto, S.³ Delugas, P.⁴ Raineri, V.⁵ Toro, R.G.⁶ Catalano, M.R.⁷ Malandrino, G.⁸

12
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- to be published
- Fiorenza P., Lo Nigro R., Raineri V; to be published
- Fiorenza, P.¹ Lo Nigro, R.² Raineri, V.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.