Effects of Ti-doping on the structural, electrical and multiferroic properties of Bi2Fe4O9 thin films

Ceramics International

Volumn 40, Issue 9 PART A, 2014, Pages 14165-14170

  Murugesan Raghavan, Chinnambedu ^a   Kim, Jin Won ^a   Choi, Ji Ya ^a   Kim, Jong Woo ^b   Kim, Sang Su ^a  

^a Changwon National University   (South Korea)

^b Korea Institute of Material Science   (South Korea)

Author keywords

A. Sol gel processes; C. Electrical properties; C. Multiferroic properties; D. Mullite

Indexed keywords

SILICATE MINERALS; SOL-GEL PROCESS; X RAY DIFFRACTION;

CHEMICAL SOLUTION DEPOSITION METHOD; FERROELECTRIC HYSTERESIS LOOP; MULTIFERROIC PROPERTIES; ORTHORHOMBIC STRUCTURES; POLYCRYSTALLINE; REMNANT POLARIZATIONS; ROOM TEMPERATURE; WEAK FERROMAGNETISM;

THIN FILMS;

EID: 84905911006     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ceramint.2014.06.003     Document Type: Article

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