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Volumn 20, Issue 33, 2014, Pages 10446-10450

Atomic force microscopy of novel zeolitic materials prepared by top-down synthesis and ADOR mechanism

Author keywords

assembly; atomic force microscopy; top down synthesis; UTL; zeolites

Indexed keywords

ASSEMBLY; ATOMIC FORCE MICROSCOPY; GRAIN BOUNDARIES; OPTICAL PROPERTIES; X RAY DIFFRACTION; ZEOLITES;

EID: 84905502669     PISSN: 09476539     EISSN: 15213765     Source Type: Journal    
DOI: 10.1002/chem.201402887     Document Type: Article
Times cited : (11)

References (29)
  • 10
    • 0034678628 scopus 로고    scopus 로고
    • Angew. Chem. Int. Ed. 2000, 39, 1499-1501.
    • (2000) Angew. Chem. Int. Ed. , vol.39 , pp. 1499-1501
  • 22
    • 53549106364 scopus 로고    scopus 로고
    • Angew. Chem. Int. Ed. 2008, 47, 5327-5330.
    • (2008) Angew. Chem. Int. Ed. , vol.47 , pp. 5327-5330


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.