Controlling relative fundamental crystal growth rates in silicalite: AFM observation

Journal of the American Chemical Society

Volumn 129, Issue 49, 2007, Pages 15192-15201

  Meza, L Itzel ^a   Anderson, Michael W ^a   Agger, Jonathan R ^a   Cundy, Colin S ^a   Chong, Chin B ^a   Plaisted, Richard J ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; DEFECT DENSITY; MICROPOROUS MATERIALS; NUCLEATION;

SURFACE NUCLEATION; TERRACE SPREADING;

SILICON COMPOUNDS;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; CRYSTAL STRUCTURE; CRYSTALLIZATION; DENSITY; DEPOLYMERIZATION; GROWTH RATE; MATHEMATICAL COMPUTING; MONTE CARLO METHOD;

EID: 37049009310     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja0739887     Document Type: Article

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