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Volumn 44, Issue 1, 2013, Pages 89-92

Development of oxide TFT's structures

Author keywords

coplanar; IGZO; Metal Oxide semiconductor; OLED; reliability; structure; TFT

Indexed keywords

MOS DEVICES; RELIABILITY; STRUCTURE (COMPOSITION);

EID: 84904998501     PISSN: 0097966X     EISSN: 21680159     Source Type: Conference Proceeding    
DOI: 10.1002/j.2168-0159.2013.tb06148.x     Document Type: Article
Times cited : (47)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.