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Volumn 44, Issue 1, 2013, Pages 89-92
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Development of oxide TFT's structures
a a a a a a a |
Author keywords
coplanar; IGZO; Metal Oxide semiconductor; OLED; reliability; structure; TFT
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Indexed keywords
MOS DEVICES;
RELIABILITY;
STRUCTURE (COMPOSITION);
COPLANAR;
IGZO;
METAL OXIDE SEMICONDUCTOR;
OLED;
TFT;
THIN FILM TRANSISTORS;
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EID: 84904998501
PISSN: 0097966X
EISSN: 21680159
Source Type: Conference Proceeding
DOI: 10.1002/j.2168-0159.2013.tb06148.x Document Type: Article |
Times cited : (47)
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References (8)
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