Face sketch landmarks localization in the wild

IEEE Signal Processing Letters

Volumn 21, Issue 11, 2014, Pages 1321-1325

  Yang, Heng ^a   Zou, Changqing ^b,c   Patras, Ioannis ^a  

^a QUEEN MARY UNIVERSITY OF LONDON   (United Kingdom)

^b SHENZHEN INSTITUTES OF ADVANCED TECHNOLOGY   (China)

^c HENGYANG NORMAL UNIVERSITY   (China)

Author keywords

Cascaded pose regression; face sketch; facial landmark localization

Indexed keywords

ELECTRICAL ENGINEERING; SIGNAL PROCESSING;

CASCADED POSE REGRESSION; COMPETITIVE PERFORMANCE; FACE REGIONS; FACE SKETCH; FACIAL LANDMARK; MANUAL ANNOTATION; MULTI-MODALITY; PHOTO IMAGES;

EDGE DETECTION;

EID: 84904213430     PISSN: 10709908     EISSN: None     Source Type: Journal    
DOI: 10.1109/LSP.2014.2333544     Document Type: Article

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