A statistical model for electromigration failures

Proceedings - International Symposium on Quality Electronic Design, ISQED

Volumn 2000-January, Issue , 2000, Pages 45-50

  Yoh, Gilbert ^a   Najm, Farid N ^b  

^a AGILENT TECHNOLOGIES   (United States)

^b UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CODES (SYMBOLS);

ELECTROMIGRATION FAILURES; EMPIRICAL DATA; ESTIMATION METHODOLOGIES; FAILURE DATA; FAILURE TIME; FAILURE-TIME DISTRIBUTION; PHYSICAL MODEL; STATISTICAL MODELING;

ELECTROMIGRATION;

EID: 84904088212     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2000.838852     Document Type: Conference Paper

References (16)

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