Studies of degradation behaviors of poly (3-hexylthiophene) layers by X-ray photoelectron spectroscopy

Surface and Interface Analysis

Volumn 46, Issue 8, 2014, Pages 544-549

  Seo, Hyun Ook ^a   Jeong, Myung Geun ^a   Kim, Kwang Dae ^a   Kim, Dae Han ^a   Kim, Young Dok ^a,b   Lim, Dong Chan ^c  

^a Sungkyunkwan University   (South Korea)

^b Korea Research Institute of Chemical Technology   (South Korea)

^c Korea Institute of Material Science   (South Korea)

Author keywords

oxidation; P3HT; UPS; XPS

Indexed keywords

CARRIER MOBILITY; OXIDATION;

DEGRADATION BEHAVIOR; HIGHEST OCCUPIED MOLECULAR ORBITAL; P3HT; POLY (3-HEXYLTHIOPHENE); POLY(3-HEXYLTHIOPHENE-2 ,5-DIYL); UPS; VALENCE BAND SPECTRA;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84904069819     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.5557     Document Type: Article

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