Electronic speckle pattern Interferometry at long infrared wavelengths. Scattering requirements

Fringe 2009 - 6th International Workshop on Advanced Optical Metrology

Volumn , Issue , 2009, Pages 596-599

  Vandenrijt, Jean François ^a   Thizy, Cédric ^a   Alexeenko, Igor ^b   Jorge, Iagoba ^c   López, Ion ^c   De Ocáriz, Idurre Sáez ^c   Pedrini, Giancarlo ^b   Osten, Wolfgang ^b   Georges, Marc ^a  

^a UNIVERSITY OF LIÈGE   (Belgium)

^b UNIVERSITY OF STUTTGART   (Germany)

^c CTA Aeronautical Technologies Center Bizkaia Technological Park   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84904022278     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1007/978-3-642-03051-2_102     Document Type: Conference Paper

References (4)

1. Kreis, T, (1996), Holographic Interferometry - Principles and Methods, Vol. 1, Akademie Verlag Series in optical metrology, Berlin.
2. Vandenrijt, J-F, Georges, M, (2007) Infrared Electronic Speckle Pattern Interferometry at 10 μm, SPIE 6616-72
3. Vandenrijt, J-F, Georges, M, (2008) Holographic techniques at long wave infrared wavelengths, Proc. of Int'l Symposium to Commemorate the 60th Anniversary of the Invention of Holography, 300-307
4. Yamaguchi, I (2003) Fundamentals and applications of speckle, SPIE 4933, 1-8