Infrared Electronic Speckle Pattern Interferometry at 10 μm

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6616, Issue PART 2, 2007, Pages

  Vandenrijt, J F ^a   Georges, M ^a  

^a UNIVERSITY OF LIÈGE   (Belgium)

Author keywords

ESPI; Infrared; Interferometry

Indexed keywords

HOLOGRAPHY; INFRARED RADIATION; PERTURBATION TECHNIQUES; SCATTERING; SPECKLE; WAVELENGTH;

HOLOGRAPHIC DISPLACEMENT MEASUREMENTS; INFRARED ELECTRONIC SPECKLE PATTERN INTERFEROMETRY; METALLIC PLATES; OPAQUE SCATTERING OBJECTS; PHASE SHIFTING TECHNIQUES; THEODOLITE; THERMAL CAMERA;

INTERFEROMETRY;

EID: 36249011961     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.726232     Document Type: Conference Paper

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