Temperature dependent Raman scattering studies of three dimensional topological insulators Bi2Se3

Journal of Applied Physics

Volumn 115, Issue 17, 2014, Pages

  Irfan, Bushra ^a   Sahoo, Satyaprakash ^b   Gaur, Anand P S ^b   Ahmadi, Majid ^b   Guinel, Maxime J F ^b   Katiyar, Ram S ^b   Chatterjee, Ratnamala ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

^b UNIVERSITY OF PUERTO RICO   (Puerto Rico)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC INSULATORS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; PHONONS; RAMAN SCATTERING; SINGLE CRYSTALS;

BRIDGMAN TECHNIQUES; HIGH QUALITY SINGLE CRYSTALS; LAUE DIFFRACTION; POLARIZATION EFFECT; TEMPERATURE COEFFICIENT; TEMPERATURE DEPENDENT; TEMPERATURE DEPENDENT RAMAN SCATTERING; TOPOLOGICAL INSULATORS;

RAMAN SPECTROSCOPY;

EID: 84903895021     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/1.4871860     Document Type: Conference Paper

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