SCOPUS 정보 검색 플랫폼

Journal of Physics: Conference Series

Volumn 522, Issue 1, 2014, Pages

A practical approach to quantify the ADF detector in STEM

(2) He, D S a Li, Z Y a

a UNIVERSITY OF BIRMINGHAM (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); TRANSMISSION ELECTRON MICROSCOPY;

BEAM CURRENTS; BLACK LEVEL; DARK FIELD; EFFICIENCY MAPS; NON-UNIFORM; SCANNING TRANSMISSION ELECTRON MICROSCOPES;

ELECTRON MICROSCOPY;

EID: 84902981924 PISSN: 17426588 EISSN: 17426596 Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/522/1/012017 Document Type: Conference Paper

Times cited : (21)

References (7)

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2
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3
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4
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- Lebeau, J.M.¹ Stemmer, S.²

5
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6
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- JEOL Instruction Manual 2007 (EM-24560)
- (2007) JEOL Instruction Manual

7
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- 10.1016/j.ultramic.2012.09.001 0304-3991
- Findlay S D and LeBeau J M 2013 Ultramicroscopy 124 52
- (2013) Ultramicroscopy , vol.124 , pp. 52
- Findlay, S.D.¹ Lebeau, J.M.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.