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Volumn 26, Issue 28, 2014, Pages

Force microscopy of layering and friction in an ionic liquid

Author keywords

AFM; friction; ionic liquids

Indexed keywords

ATOMIC FORCE MICROSCOPY; FRICTION; LIQUIDS;

EID: 84902973340     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/26/28/284110     Document Type: Article
Times cited : (55)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.