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Volumn 43, Issue 27, 2014, Pages 10593-10601

Ab initio structure determination of interlayer expanded zeolites by single crystal rotation electron diffraction

(9) Guo, Peng a Liu, Leifeng a Yun, Yifeng a Su, Jie a Wan, Wei a Gies, Hermann b Zhang, Haiyan c Xiao, Feng Shou c Zou, Xiaodong a

a STOCKHOLM UNIVERSITY (Sweden)

b RUHR UNIVERSITY BOCHUM (Germany)

c ZHEJIANG UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; ELECTRON DIFFRACTION; RIETVELD REFINEMENT; SILICATES; SILICON; SINGLE CRYSTALS; X RAY DIFFRACTION;

AB INITIO STRUCTURE; AUTOMATED COLLECTION; CONVENTIONAL METHODS; INTERNATIONAL NETWORKS; POWDER X-RAY DIFFRACTION (PXRD); SINGLE CRYSTAL X-RAY DIFFRACTION; STRUCTURE REFINEMENTS; STRUCTURE SOLUTIONS;

ZEOLITES;

EID: 84902683052 PISSN: 14779226 EISSN: 14779234 Source Type: Journal
DOI: 10.1039/c4dt00458b Document Type: Article

Times cited : (14)

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