Rapid quantitative phase imaging for partially coherent light microscopy

Optics Express

Volumn 22, Issue 11, 2014, Pages 13472-13483

  Rodrigo, José A ^a   Alieva, Tatiana ^a  

^a UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY;

ELECTRICALLY TUNABLE; HIGH SPEED MEASUREMENTS; IMAGING APPLICATIONS; PARTIALLY COHERENT ILLUMINATION; PARTIALLY COHERENT LIGHT; QUANTITATIVE PHASE IMAGING; SIMULTANEOUS DETERMINATIONS; SPATIAL COHERENCE PROPERTIES;

OPTICAL MICROSCOPY;

EID: 84901857987     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.22.013472     Document Type: Article

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