A Monte Carlo-adjusted goodness-of-fit test for parametric models describing spatial point patterns

Journal of Computational and Graphical Statistics

Volumn 23, Issue 2, 2014, Pages 497-517

  Dao, Ngoc Anh ^a   Genton, Marc G ^b  

^a TEXAS A AND M UNIVERSITY   (United States)

^b KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Saudi Arabia)

Author keywords

Adjusted level; Distribution of p values; Level bias; Nested Monte Carlo simulation; Spatial point process

Indexed keywords

EID: 84901817147     PISSN: 10618600     EISSN: 15372715     Source Type: Journal    
DOI: 10.1080/10618600.2012.760459     Document Type: Article

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