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Volumn 85, Issue 5, 2014, Pages

A novel von Hamos spectrometer for efficient X-ray emission spectroscopy in the laboratory

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL SPECIATION; ELECTROMAGNETIC WAVE EMISSION; EMISSION SPECTROSCOPY; X RAY SCATTERING;

EID: 84901716705     PISSN: 00346748     EISSN: 10897623     Source Type: Journal    
DOI: 10.1063/1.4875986     Document Type: Article
Times cited : (76)

References (15)
  • 4
    • 0032384206 scopus 로고    scopus 로고
    • 10.1002/(SICI)1097-4539(199805/06)27:3<173::AID-XRS266>3.0.CO;2-P
    • N. Kallithrakas-Kontos and R. Moshohoritou, X-Ray Spectrom. 27, 173 (1998). 10.1002/(SICI)1097-4539(199805/06)27:3<173::AID-XRS266>3.0.CO;2-P
    • (1998) X-Ray Spectrom. , vol.27 , pp. 173
    • Kallithrakas-Kontos, N.1    Moshohoritou, R.2
  • 5
    • 0034367626 scopus 로고    scopus 로고
    • 10.1002/1097-4539(200011/12)29:6<426::AID-XRS447>3.0.CO;2-O
    • T. Mukoyama, K. Taniguchi, and H. Adachi, X-Ray Spectrom. 29, 426 (2000). 10.1002/1097-4539(200011/12)29:6<426::AID-XRS447>3.0.CO;2-O
    • (2000) X-Ray Spectrom. , vol.29 , pp. 426
    • Mukoyama, T.1    Taniguchi, K.2    Adachi, H.3
  • 8


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.