Universal trap effect in carrier transport of disordered organic semiconductors: Transition from shallow trapping to deep trapping

Journal of Physical Chemistry C

Volumn 118, Issue 20, 2014, Pages 10651-10660

  Li, Chen ^a   Duan, Lian ^a   Li, Haoyuan ^a   Qiu, Yong ^a  

^a Tsinghua University   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; CARRIER CONCENTRATION; MONTE CARLO METHODS; TRAJECTORIES;

DIFFERENT EFFECTS; HOLE TRANSPORTS; SCATTERING CENTERS; TEMPERATURE DEPENDENCE; THERMAL REACTIVATION; TIME OF FLIGHT; TRANSITION REGIONS; UNIVERSAL MECHANISMS;

CARRIER TRANSPORT;

EID: 84901326723     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp5022906     Document Type: Article

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