Attacking PUF-based pattern matching key generators via helper data manipulation

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 8366 LNCS, Issue , 2014, Pages 106-131

  Delvaux, Jeroen ^a   Verbauwhede, Ingrid ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

fuzzy extractor; Hamming distance; helper data; PUF; secret key

Indexed keywords

ACCESS CONTROL; CMOS INTEGRATED CIRCUITS; HAMMING DISTANCE; PATTERN MATCHING;

65NM CMOS TECHNOLOGY; FUZZY EXTRACTORS; HELPER DATA; INTEGRATED CIRCUITS (ICS); MANUFACTURING VARIATION; PHYSICALLY UNCLONABLE FUNCTIONS; PUF; SECRET KEY;

CRYPTOGRAPHY;

EID: 84901277586     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-319-04852-9_6     Document Type: Conference Paper

References (14)

1. Boyen, X., Dodis, Y., Katz, J., Ostrovsky, R., Smith, A.: Secure Remote Authentication Using Biometric Data. In: Cramer, R. (ed.) EUROCRYPT 2005. LNCS, vol. 3494, pp. 147-163. Springer, Heidelberg (2005) (Pubitemid 41313951)
2. Dodis, Y., Ostrovsky, R., Reyzin, L., Smith, A.: Fuzzy Extractors: How to Generate Strong Keys from Biometrics and Other Noisy Data. SIAM J. Comput. 38(1), 97-139 (2008)
3. Hospodar, G., Maes, R., Verbauwhede, I.: Machine Learning Attacks on 65nm Arbiter PUFs: Accurate Modeling poses strict Bounds on Usability. In: Workshop on Information Forensics and Security (WIFS), pp. 37-42. IEEE (December 2012)
4. Koeberl, P., Maes, R., Rožić, V., Van der Leest, V., Van der Sluis, E., Verbauwhede, I.: Experimental Evaluation of Physically Unclonable Functions in 65 nmCMOS. In: 2012 IEEE Conference on European Solid-State Circuits (ESSCIRC), pp. 486-489 (September 2012)
5. Konczakowska, A., Wilamowski, B.M.: Noise in Semiconductor Devices. In: Industrial Electronics Handbook, 2nd edn. Fundamentals of Industrial Electronics, vol. 1, ch. 11. CRC Press (2011)
6. Kuhn, K., Kenyon, C., Kornfeld, A., Liu, M., Maheshwari, A., Shih, W., Sivakumar, S., Taylor, G., Van Der Voorn, P., Zawadzki, K.: Managing Process Variation in Intel's 45nm CMOS Technology. Intel Technology Journal 12(2), 92-110 (2008)
7. Lee, J.W., Lim, D., Gassend, B., Suh, G.E., van Dijk, M., Devadas, S.: A technique to build a secret key in integrated circuits for identification and authentication applications. In: 2004 Symposium on VLSI Circuits, pp. 176-179 (June 2004)
8. Merli, D., Schuster, D., Stumpf, F., Sigl, G.: Side-channel analysis of PUFs and fuzzy extractors. In: McCune, J.M., Balacheff, B., Perrig, A., Sadeghi, A.-R., Sasse, A., Beres, Y. (eds.) TRUST 2011. LNCS, vol. 6740, pp. 33-47. Springer, Heidelberg (2011)
9. Paral, Z., Devadas, S.: Reliable and Efficient PUF-Based Key Generation Using Pattern Matching. In: 2011 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST), pp. 128-133 (June 2011)
10. Paral, Z., Devadas, S., Verayo Inc.: Patent WO/2012/099657, Reliable PUF value generation by pattern matching (July 26, 2012)
11. Rührmair, U., Devadas, S., Koushanfar, F.: Security based on Physical Unclonability and Disorder. Introduction to Hardware Security and Trust. Springer, Book Chapter (2011)
12. Rührmair, U., Sehnke, F., Sölter, J., Dror, G., Devadas, S., Schmidhuber, J.: Modeling attacks on physical unclonable functions. In: 2010 ACM Conference on Computer and Communications Security (CCS), pp. 237-249 (October 2010)
13. Skorobogatov, S.: Semi-invasive attacks - a new approach to hardware security analysis, Technical Report UCAM-CL-TR-630, University of Cambridge, Computer Laboratory (April 2005)
14. Tuyls, P., Schrijen, G.-J., Škorić, B., van Geloven, J., Verhaegh, N., Wolters, R.: Read-Proof Hardware from Protective Coatings. In: Goubin, L., Matsui, M. (eds.) CHES 2006. LNCS, vol. 4249, pp. 369-383. Springer, Heidelberg (2006)