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Volumn , Issue , 2012, Pages 486-489
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Experimental evaluation of Physically Unclonable Functions in 65 nm CMOS
a a a b c c |
Author keywords
[No Author keywords available]
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Indexed keywords
ASIC DESIGN FLOW;
COMPARATIVE ANALYSIS;
EXPERIMENTAL EVALUATION;
LOW POWER;
SILICON DEVICES;
SILICON TECHNOLOGIES;
STANDARD CELL;
TEST CHIPS;
TEST VEHICLE;
VARYING TEMPERATURE;
ELECTRIC BATTERIES;
INTEGRATED CIRCUITS;
SILICON;
CRYPTOGRAPHY;
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EID: 84870784876
PISSN: 19308833
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ESSCIRC.2012.6341361 Document Type: Conference Paper |
Times cited : (115)
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References (8)
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