Potentiometric-scanning ion conductance microscopy

Langmuir

Volumn 30, Issue 19, 2014, Pages 5669-5675

  Zhou, Yi ^a   Chen, Chiao Chen ^a   Weber, Anna E ^a   Zhou, Lushan ^a   Baker, Lane A ^a  

^a INDIANA UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PROBES;

IMAGE INTERPRETATION; ION CONDUCTANCE; MODEL CALCULATIONS; OPERATION MECHANISM; PROBE POSITION; SIZE DIFFERENCE;

POTENTIOMETERS (ELECTRIC MEASURING INSTRUMENTS);

ION;

CHEMISTRY; MICROSCOPY; POTENTIOMETRY; PROCEDURES;

IONS; MICROSCOPY; POTENTIOMETRY;

EID: 84901044353     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la500911w     Document Type: Article

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