Statistical length measurement method by direct imaging of carbon nanotubes

ACS Applied Materials and Interfaces

Volumn 6, Issue 9, 2014, Pages 6139-6146

  Bengio, E Amram ^a,b   Tsentalovich, Dmitri E ^a   Behabtu, Natnael ^a   Kleinerman, Olga ^b   Kesselman, Ellina ^b   Schmidt, Judith ^b   Talmon, Yeshayahu ^b   Pasquali, Matteo ^a,c  

^a Rice University   (United States)

^b TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^c RICE UNIVERSITY   (United States)

Author keywords

bootstrap method; carbon nanotubes; chlorosulfonic acid; cryo TEM; length measurement; statistical re sampling

Indexed keywords

SAMPLING; TRANSMISSION ELECTRON MICROSCOPY;

BOOTSTRAP METHOD; CHLOROSULFONIC ACID; CRYO-TEM; LENGTH MEASUREMENT; RESAMPLING;

CARBON NANOTUBES;

CARBON NANOTUBE;

ATOMIC FORCE MICROSCOPY; CRYOELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

CRYOELECTRON MICROSCOPY; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, TRANSMISSION; NANOTUBES, CARBON;

EID: 84900855780     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am500424u     Document Type: Conference Paper

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