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Volumn 8835, Issue , 2013, Pages

Accurate measurement of LED lens surface temperature

Author keywords

IR thermal imaging system; lens surface temperature; light emitting diode; thermocouple; thermocouple shielding

Indexed keywords

ATMOSPHERIC TEMPERATURE; IMAGING SYSTEMS; INFRARED IMAGING; OPTICAL INSTRUMENT LENSES; SILICONES; SURFACE PROPERTIES; TEMPERATURE MEASUREMENT; THERMOCOUPLES;

EID: 84899975293     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.2023091     Document Type: Conference Paper
Times cited : (14)

References (10)
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    • Life tests and failure mechanisms of gan/a1ganiingan light emitting diodes
    • doi: 10.1117/12.304426
    • Barton, D. L., Osinski, M., Perlin, P., Helms, C. J., and Berg, N. H., "Life tests and failure mechanisms of GaN/A1GaNIInGaN Light emitting Diodes," Proc. SPIE 3279, 17-27 (1998). doi: 10.1117/12.304426
    • (1998) Proc. SPIE , vol.3279 , pp. 17-27
    • Barton, D.L.1    Osinski, M.2    Perlin, P.3    Helms, C.J.4    Berg, N.H.5
  • 2
    • 84872194959 scopus 로고    scopus 로고
    • White light quality of phosphor converted leds from a phosphor materials perspective of view; An evaluation based on combined thermal and optical simulations
    • doi: 10.1117/12.929970
    • Wenzl, F.-P., Sommer, C., Hartmann, P., Pachler, P., Hoschopf, H., Langer, G., Fulmek, P., and Nicolics, J., "White light quality of phosphor converted LEDs from a phosphor materials perspective of view: an evaluation based on combined thermal and optical simulations," Proc. SPIE 8484, 848403-1-7 (2012). doi: 10.1117/12.929970
    • (2012) Proc. SPIE , vol.8484 , pp. 84840317
    • Wenzl, F.-P.1    Sommer, C.2    Hartmann, P.3    Pachler, P.4    Hoschopf, H.5    Langer, G.6    Fulmek, P.7    Nicolics, J.8
  • 7
    • 84894012217 scopus 로고    scopus 로고
    • Omega z16 20 August 2013)
    • Omega, "Physical properties of thermoelement materials," z16, http://www.omega.com/temperature/Z/zsection.asp (20 August 2013); http://www.omega.com/temperature/Z/pdf/z016.pdf.
    • Physical Properties of Thermoelement Materials
  • 9
    • 33747622119 scopus 로고    scopus 로고
    • Effect of chip and bonding defects on the junction temperatures of high-brightness lightemitting diodes
    • doi:10.1117/1.2130127
    • Arik, M., and Stanton, W., "Effect of chip and bonding defects on the junction temperatures of high-brightness lightemitting diodes," Optical Engineering 44(11), 111305-1-8 (2005). doi:10.1117/1.2130127
    • (2005) Optical Engineering , vol.44 , Issue.11 , pp. 11130518
    • Arik, M.1    Stanton, W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.