Latest trends in millimeter-wave imaging technology

Progress in Electromagnetics Research Symposium

Volumn 1, Issue , 2008, Pages 414-417

  Oka, S ^a   Togo, H ^a   Kukutsu, N ^a   Nagatsuma, T ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRACK DETECTION; MILLIMETER WAVES; SURFACE DEFECTS;

IMAGING TECHNOLOGY; MILLIMETER-WAVE IMAGING; NONDESTRUCTIVE INSPECTION; SECURITY SURVEILLANCE; SURFACE CRACKS;

IMAGING TECHNIQUES;

EID: 84899026066     PISSN: 15599450     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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