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Volumn 64, Issue 6, 2014, Pages 780-785
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Computational validation of fractal characterization by using the wavelet-based fractal analysis
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Author keywords
1 f process; Fractals; Self similarity; Wavelet analysis
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Indexed keywords
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EID: 84898477199
PISSN: 03744884
EISSN: 19768524
Source Type: Journal
DOI: 10.3938/jkps.64.780 Document Type: Article |
Times cited : (7)
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References (18)
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