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Volumn 85, Issue 4, 2014, Pages

High-accuracy direct ZT and intrinsic properties measurement of thermoelectric couple devices

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC PROPERTIES; OPTIMIZATION; SEEBECK COEFFICIENT; THERMOCOUPLES; THERMOELECTRIC EQUIPMENT; THERMOELECTRICITY; UNCERTAINTY ANALYSIS;

EID: 84898465861     PISSN: 00346748     EISSN: 10897623     Source Type: Journal    
DOI: 10.1063/1.4870278     Document Type: Article
Times cited : (19)

References (31)
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    • edited by D. M. Rowe (Taylor and Francis Group, LLC, Boca Raton)
    • T. P. Hogan, in Thermoelectrics Handbook: Macro to Nano, edited by D. M. Rowe (Taylor and Francis Group, LLC, Boca Raton, 2006).
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    • Hogan, T.P.1
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    • 10.1103/PhysRevLett.91.148301
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    • Snyder, G.1    Ursell, T.2
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    • A. W. Penn, J. Sci. Instrum. 41, 626 (1964). 10.1088/0950-7671/41/10/311
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    • International Electrotechnical Commission (IEC) Standard 60584-2 ed1.0, 1982, "Thermocouples. Part 2: Tolerances" (IEC, Geneva, Switzerland, 1982).
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.