Nonparametric noise estimation method for raw images

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 31, Issue 4, 2014, Pages 863-871

  Colom, Miguel ^a,b   Buades, Antoni ^a,b   Morel, Jean Michel ^a,b  

^a UNIVERSITAT DE LES ILLES BALEARS   (Spain)

^b UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS;

CALIBRATION METHOD; CROSS VALIDATION; NON-PARAMETRIC NOISE; NONLINEAR DETECTORS; NONPARAMETRIC APPROACHES; PARAMETRIC METHOD; SIGNAL DEPENDENT NOISE; STANDARD DEVIATION;

ESTIMATION;

EID: 84898071555     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.31.000863     Document Type: Conference Paper

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