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Volumn 2001-January, Issue , 2001, Pages 583-588

On speeding up extended finite state machines using catalyst circuitry

Author keywords

Automata; Built in self test; Clocks; Combinational circuits; Counting circuits; Logic design; Pipeline processing; Registers; SRAM chips; Timing

Indexed keywords

BUILT-IN SELF TEST; CATALYSTS; CLOCKS; COMBINATORIAL CIRCUITS; COMPUTER AIDED DESIGN; COUNTING CIRCUITS; DESIGN; INTEGRATED CIRCUIT TESTING; LOGIC DESIGN; TIMING CIRCUITS;

EID: 84897851748     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASPDAC.2001.913371     Document Type: Conference Paper
Times cited : (12)

References (11)
  • 2
    • 0029720742 scopus 로고    scopus 로고
    • Architectural Retiming: Pipelining Latency-Constrained Circuits
    • June
    • S. Hassoun and C. Ebeling, "Architectural Retiming: Pipelining Latency-Constrained Circuits", IEEE Design Automation Conf., pp. 708-713, (June 1996).
    • (1996) IEEE Design Automation Conf. , pp. 708-713
    • Hassoun, S.1    Ebeling, C.2
  • 3
    • 0032306325 scopus 로고    scopus 로고
    • Using Pre-computation in Architecture and Logic Resynthesis
    • S. Hassoun and C. Ebeling, "Using Pre-computation in Architecture and Logic Resynthesis," Int'l Conf. on Computer-Aided Design, pp. 316-323, (1998).
    • (1998) Int'l Conf. on Computer-Aided Design , pp. 316-323
    • Hassoun, S.1    Ebeling, C.2
  • 4
    • 84969396577 scopus 로고    scopus 로고
    • Fine Grain Incremental Rescheduling via Architectural Retiming
    • S. Hassoun, "Fine Grain Incremental Rescheduling via Architectural Retiming", Int'l Symposium on System Synthesis, pp. 158-163, (1998).
    • (1998) Int'l Symposium on System Synthesis , pp. 158-163
    • Hassoun, S.1
  • 5
    • 33746763910 scopus 로고
    • Retiming Synchronous Circuits
    • C. E. Leiserson and J. B. Saxe, "Retiming Synchronous Circuits," Algorithmica, vol. 6, pp. 5-35, (1991).
    • (1991) Algorithmica , vol.6 , pp. 5-35
    • Leiserson, C.E.1    Saxe, J.B.2
  • 7
    • 0023292132 scopus 로고
    • Built-In Self-Test RAM: A Practical Alternative
    • Feb
    • K. K. Saluja et al., "Built-In Self-Test RAM: A Practical Alternative", IEEE Design and Test of Computer, pp. 42-51, (Feb. 1987).
    • (1987) IEEE Design and Test of Computer , pp. 42-51
    • Saluja, K.K.1
  • 10
    • 0019689426 scopus 로고
    • A March Test for Functional Faults in Semi-conductor Random-Access Memories
    • S. Suk and S. M. Reddy, "A March Test for Functional Faults in Semi-conductor Random-Access Memories", IEEE Trans. on Computers, C-30(12), pp. 982-985, 1981.
    • (1981) IEEE Trans. on Computers , vol.C-30 , Issue.12 , pp. 982-985
    • Suk, S.1    Reddy, S.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.