A new noise measurement method of noise parameters at microwave frequencies

IEEE Transactions on Instrumentation and Measurement

Volumn 46, Issue 4, 1997, Pages 1044-1048

  Bareau, Pascal ^a   Abdipour, Abdolali ^a   Pacaud, André ^a  

^a SUPELEC   (France)

Author keywords

Cold impedances; Least squares procedure; Microwave transistors; Noise parameters; Optimum noise figure; Power measurements

Indexed keywords

ELECTRIC IMPEDANCE MEASUREMENT; LEAST SQUARES APPROXIMATIONS; MICROWAVE DEVICES; SIGNAL NOISE MEASUREMENT; SIGNAL TO NOISE RATIO; TRANSISTORS;

MICROWAVE TRANSISTORS; NOISE PARAMETERS;

ELECTRIC POWER MEASUREMENT;

EID: 0031199022     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.650824     Document Type: Article

References (7)

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