Bias circuit topologies for minimization of RF amplifier memory effects

Conference Proceedings - 33rd European Microwave Conference, EuMC 2003

Volumn 3, Issue , 2003, Pages 1349-1352

  Khanifar, Ahmad ^a   Maslennikov, Nikolai ^a   Vassilakis, Bill ^a  

^a Powenvave Technologies Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; ELECTRIC NETWORK TOPOLOGY; FREQUENCY RESPONSE;

CIRCUIT TECHNIQUES; DECOUPLING CAPACITOR; INSTANTANEOUS BANDWIDTH; MEMORY EFFECTS; PREDISTORTION TECHNIQUES; SERIES RESONANCE; TRANSMISSION ZEROS; WIDEBAND APPLICATIONS;

AMPLIFIERS (ELECTRONIC);

EID: 84897514291     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EUMC.2003.177737     Document Type: Conference Paper

References (2)

1. Bosch W., Gatti G., "Measurement and Simulation of Memory Effects in Predistortion Linearisers", IEEE trans. On MTT, Vol. 37, No. 12, pp. 1885-1890, December 1989.
2. Vuolevi J.H.K. et al, "Measurement Technique for Characterizing Memory Effects in RF Power Amplifiers" IEEE Trans. On MTT, Vol. 30 No. 8, 1383-1389, August 2001.