Small-signal model and microwave noise performance of the 0.35μm n and p type MOSFETs, scaling down

2000 30th European Microwave Conference, EuMC 2000

Volumn , Issue , 2000, Pages

  Sakalas, Paulius ^a,b   Zirath, Herbert ^b,c   Litwin, Andrej ^d  

^a CENTER FOR PHYSICAL SCIENCES AND TECHNOLOGY   (Lithuania)

^b CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^c Ericsson Microwave Systems AB   (Sweden)

^d ERICSSON RESEARCH   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

GHZ FREQUENCIES; MICROWAVE NOISE PERFORMANCE; MINIMUM NOISE FIGURE; NOISE PARAMETERS; NOISE PERFORMANCE; OPTIMIZATION METHOD; OUTPUT CONDUCTANCE; SMALL SIGNAL MODEL;

MOSFET DEVICES;

EID: 84897501088     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EUMA.2000.338605     Document Type: Conference Paper

References (8)

1. Ericsson microelectronics internal report, "MERC CHARLOTTE ENBLOM", 1998. 12. 02
2. G. Ghibaudo, "Analytical Modelling of the MOS Transistor", Physica Status Solidi (a) 113, pp. 223-239, 1989
3. G. Ghibaudo, Electronics Letters, 24, p. 543, 1988
4. G. Ghibaudo, Physica Status Solidi, (a), 95, p. 323, 1986
5. M. Koolen, J. Geelen, M. Versleijen, "An improved deembedding technique for on-wafer high-frequency characterization", IEEE 1991 Bipolar Circuits and Technology Meeting 8. 1, pp 188-191, 1991
6. C. H. Chen, M. J. Deen, "High Frequency Noise of MOSFETs I-Modeling", Solid-State Electronics,1 Vol. 42(11), pp. 2069-2081, 1998
7. MNS, Hewlett-Packard Microwave Nonlinear Simulator (7-th release), HP Part No. 85150-90220, manual 4-th edition, printed in U. S. A., HP EE sof Division, 1400 Foutaingrove Parkway, Santa Rosa, CA 95403, U. S. A., 1996
8. C. H. Chen, M. J. Deen, Z. X. Yan, M. Schroter and C. Enz, "High Frequency Noise of MOSFETs II-Experiments, Solid-State Electronics, Vol. 42 (11), pp. 2083-2092, 1998.