Artificial neural network modeling for improved on-wafer line-reflect-match calibrations

2001 31st European Microwave Conference, EuMC 2001

Volumn , Issue , 2001, Pages

  Jargon, Jeffrey A ^a   Gupta, K C ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITY OF COLORADO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYZERS; NEURAL NETWORKS; SCATTERING PARAMETERS;

ARTIFICIAL NEURAL NETWORK MODELING; LINE REFLECT MATCHES; MEASUREMENT DATA; ON-WAFER; PARAMETER ERROR; THRU REFLECT LINES; TRL CALIBRATION; VECTOR NETWORK ANALYZERS;

CALIBRATION;

EID: 84897496371     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EUMA.2001.339007     Document Type: Conference Paper

References (9)

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