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Volumn 130, Issue , 2014, Pages 13-22

Reliability of event-related potentials: The influence of number of trials and electrodes

Author keywords

Emotional facial expressions; Event related potentials; Feedback; Retest reliability

Indexed keywords

ADULT; ARTICLE; DISGUST; ELECTRODE; EMOTION; EVENT RELATED POTENTIAL; FACIAL EXPRESSION; FEEDBACK SYSTEM; FEMALE; HAPPINESS; HUMAN; HUMAN EXPERIMENT; LATENT PERIOD; NORMAL HUMAN; PRIORITY JOURNAL; SPATIOTEMPORAL ANALYSIS; TEST RETEST RELIABILITY; ADOLESCENT; BRAIN; DEVICES; ELECTROENCEPHALOGRAPHY; EVOKED RESPONSE; NEUROPSYCHOLOGICAL TEST; PATTERN RECOGNITION; PHOTOSTIMULATION; PHYSIOLOGY; PROCEDURES; REPRODUCIBILITY; TIME; YOUNG ADULT;

EID: 84897473045     PISSN: 00319384     EISSN: 1873507X     Source Type: Journal    
DOI: 10.1016/j.physbeh.2014.03.008     Document Type: Article
Times cited : (132)

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