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Volumn 48, Issue 10, 2011, Pages 1420-1425

Longer term test-retest reliability of error-related brain activity

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EID: 80052734259     PISSN: 00485772     EISSN: 14698986     Source Type: Journal    
DOI: 10.1111/j.1469-8986.2011.01206.x     Document Type: Article
Times cited : (103)

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