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Volumn 70, Issue 2, 2014, Pages 390-394

X-ray resonant single-crystal diffraction technique, a powerful tool to investigate the kesterite structure of the photovoltaic Cu2ZnSnS 4 compound

Author keywords

disorder; keserite; photovoltaic materials; X ray resonant single crystal diffraction

Indexed keywords

SINGLE CRYSTALS; X RAY DIFFRACTION; ZINC;

EID: 84897464498     PISSN: 20525192     EISSN: 20525206     Source Type: Journal    
DOI: 10.1107/S2052520614003138     Document Type: Article
Times cited : (66)

References (23)
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    • Agilent Technologies (2013). CrysAlis PRO. Agilent Technologies UK Ltd, Yarnton, Oxfordshire, England
    • Agilent Technologies (2013). CrysAlis PRO. Agilent Technologies UK Ltd, Yarnton, Oxfordshire, England.
  • 16
    • 77949762322 scopus 로고    scopus 로고
    • Persson, C. (2010). J. Appl. Phys. 107, 053710-053710-8.
    • (2010) J. Appl. Phys , vol.107 , pp. 053710-0537108
    • Persson, C.1
  • 17
  • 20
    • 84897428256 scopus 로고    scopus 로고
    • Valakh, M. Y., Kolomys, O. F., Ponomaryov, S. S., Yukhymchuk, V. O., Babichuk, I. S., Izquierdo-Roca, V., Saucedo, E., Perez-Rodriguez
    • Valakh, M. Y., Kolomys, O. F., Ponomaryov, S. S., Yukhymchuk, V. O., Babichuk, I. S., Izquierdo-Roca, V., Saucedo, E., Perez-Rodriguez


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.