A method for accurate texture determination of thin oxide films by glancing-angle laboratory X-ray diffraction

Journal of Applied Crystallography

Volumn 47, Issue 2, 2014, Pages 575-583

  Garner, Alistair ^a   Preuss, Michael ^a   Frankel, Philipp ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

glancing angle X ray diffraction; texture; thin oxide films

Indexed keywords

OXIDE FILMS; X RAY DIFFRACTION;

ACCURATE MEASUREMENT; CRYSTALLOGRAPHIC PLANE; DIFFRACTION PROFILES; INTEGRATED INTENSITIES; MULTIPHASE MATERIALS; SYNCHROTRON X RAY DIFFRACTION; TEXTURE MEASUREMENT; THIN OXIDE FILMS;

TEXTURES;

EID: 84897431063     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S1600576714000569     Document Type: Article

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