Pan-sharpening algorithm to remove thin cloud via mask dodging and nonsampled shift-invariant shearlet transform

Journal of Applied Remote Sensing

Volumn 8, Issue 1, 2014, Pages

  Shi, Cheng ^a   Liu, Fang ^a   Li, Ling Ling ^a   Hao, Hong Xia ^a  

^a XIDIAN UNIVERSITY   (China)

Author keywords

adaptive principal component analysis; mask dodging; nonsampled shift invariant shearlet transform; pan sharpening

Indexed keywords

IMAGE RESOLUTION;

EVALUATION METRICS; FILTERING ALGORITHM; PAN-SHARPENING; PANCHROMATIC IMAGES; PRINCIPAL COMPONENT ANALYSIS TRANSFORMS; SHEARLET TRANSFORMS; SPATIAL RESOLUTION; SPECTRAL INFORMATION;

PRINCIPAL COMPONENT ANALYSIS;

EID: 84897144830     PISSN: None     EISSN: 19313195     Source Type: Journal    
DOI: 10.1117/1.JRS.8.083658     Document Type: Article

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