An efficient pan-sharpening method via a combined adaptive PCA approach and contourlets

IEEE Transactions on Geoscience and Remote Sensing

Volumn 46, Issue 5, 2008, Pages 1323-1335

  Shah, Vijay P ^a,b   Younan, Nicolas H ^a   King, Roger L ^a  

^a MISSISSIPPI STATE UNIVERSITY   (United States)

^b NATIONAL CANCER INSTITUTE   (United States)

Author keywords

Contourlets; Image fusion; Pan sharpening; Principal component analysis (PCA); Wavelets

Indexed keywords

CONDUCTIVE PLASTICS; IMAGE CLASSIFICATION; VECTOR QUANTIZATION;

CONTOURLETS; IMAGE FUSION; PAN-SHARPENING; PRINCIPAL COMPONENT ANALYSIS (PCA); WAVELETS;

PRINCIPAL COMPONENT ANALYSIS;

EID: 53349157432     PISSN: 01962892     EISSN: None     Source Type: Journal    
DOI: 10.1109/TGRS.2008.916211     Document Type: Article

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