On the sensitivity of directions that support Voigt wave propagation in infiltrated biaxial dielectric materials

Journal of Nanophotonics

Volumn 8, Issue 1, 2014, Pages

  Mackay, Tom G ^a,b  

^a UNIVERSITY OF EDINBURGH   (United Kingdom)

^b The Pennsylvania State University   (United States)

Author keywords

extended Bruggeman homogenization formalism; optical sensing; Voigt waves

Indexed keywords

REFRACTIVE INDEX; WAVE PROPAGATION;

BRUGGEMAN HOMOGENIZATION FORMALISM; CONSTITUTIVE PARAMETERS; DEGREES OF ANISOTROPY; HOMOGENIZED COMPOSITES; MAXIMUM SENSITIVITY; OPTICAL SENSING; SECONDARY INFLUENCES; VOIGT WAVES;

DIELECTRIC MATERIALS;

EID: 84897130971     PISSN: None     EISSN: 19342608     Source Type: Journal    
DOI: 10.1117/1.JNP.8.083993     Document Type: Article

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