Image resolution in optical nanoscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8815, Issue , 2013, Pages

  Nieuwenhuizen, Robert P J ^a   Stallinga, Sjoerd ^a   Rieger, Bernd ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

emitter localization; image resolution; multiple activations; Super resolution imaging

Indexed keywords

ACTIVATION CYCLES; DIFFRACTION LIMITS; EMITTER LOCALIZATION; FLUORESCENT EMITTERS; MEASUREMENT TIME; NUMBER OF CYCLES; SUPER RESOLUTION IMAGING; SUPER-RESOLUTION MICROSCOPY;

CHEMICAL ACTIVATION; DIFFRACTION; FLUORESCENCE; IMAGE RECONSTRUCTION; UNCERTAINTY ANALYSIS;

IMAGE RESOLUTION;

EID: 84896870246     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.2025352     Document Type: Conference Paper

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