Reassessment of the intrinsic carrier density temperature dependence in crystalline silicon

Journal of Applied Physics

Volumn 115, Issue 9, 2014, Pages

  Couderc, Romain ^a,b   Amara, Mohamed ^b   Lemiti, Mustapha ^a  

^a UNIVERSITÉ DE LYON   (France)

^b UNIVERSITÉ DE LYON   (France)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR MATERIALS; SILICON;

CRYSTALLINE SILICONS; POLYNOMIAL FIT; SILICON DEVICES; TEMPERATURE DEPENDENCE; THERMAL BEHAVIORS;

TEMPERATURE DISTRIBUTION;

EID: 84896750202     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/1.4867776     Document Type: Article

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