On the poisson ratio and XRD determination of strain in thin films of Ce0.8Gd0.2O1.9

Journal of Electroceramics

Volumn 32, Issue 1, 2014, Pages 47-50

  Kossoy, Anna ^a,b   Wachtel, Ellen ^a   Lubomirsky, Igor ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

^b UNIVERSITY OF ICELAND   (Iceland)

Author keywords

Chemical strain; Gd doped ceria; Thin films; XRD strain measurements

Indexed keywords

CERIUM; POINT DEFECTS; POISSON RATIO; STRAIN; THIN FILMS;

BROAD TEMPERATURE RANGES; DIFFRACTION PEAKS; ELASTIC MATERIALS; ELASTIC STRAIN; GD DOPED CERIA; ROOM TEMPERATURE; STRAIN TENSOR; XRD MEASUREMENTS;

GADOLINIUM;

EID: 84896492660     PISSN: 13853449     EISSN: 15738663     Source Type: Journal    
DOI: 10.1007/s10832-013-9835-7     Document Type: Article

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