Grain boundary character and recombination properties in CdTe thin films

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2013, Pages 3249-3254

  Moutinho, H R ^a   Moseley, J ^a   Romero, M J ^a   Dhere, R G ^a   Jiang, C S ^a   Jones, K M ^a   Duenow, J N ^a   Yan, Y ^a   Al Jassim, M M ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

Cathodoluminescence; CdTe; Electron backscatter diffraction; Grain boundaries properties

Indexed keywords

CADMIUM TELLURIDE; CATHODOLUMINESCENCE; ELECTRON DIFFRACTION; THIN FILMS; VAPORS;

CDTE; CRYSTALLOGRAPHIC ORIENTATIONS; ELECTRON BACK SCATTER DIFFRACTION; ELECTROOPTICAL PROPERTIES; GRAIN BOUNDARY CHARACTER; PROVIDE GUIDANCES; RELATIVE FRACTION; VAPOR-TRANSPORT TECHNIQUES;

GRAIN BOUNDARIES;

EID: 84896479215     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2013.6745144     Document Type: Conference Paper

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