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Volumn , Issue , 2013, Pages 2195-2200

High efficiency at module level with almost no cell metallisation: Multiple wire interconnection of reduced metal solar cells

Author keywords

Cost of ownership; Interconnection; Laser doping; Multiple busbars; Photovoltaic cells; Reduced metallization

Indexed keywords

BUSBARS; METALLIZING; PHOTOVOLTAIC CELLS; WIRE;

EID: 84896464740     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2013.6744911     Document Type: Conference Paper
Times cited : (5)

References (8)
  • 1
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    • High reliability of conductive adhesives for thin-film interconnects
    • R. Wells, et al., "High reliability of conductive adhesives for thin-film interconnects", in PV Production Forum, 2011.
    • (2011) PV Production Forum
    • Wells, R.1
  • 6
    • 84896472537 scopus 로고    scopus 로고
    • ITRPV, International Technology Roadmap for Photovoltaics, SEMI PV Group Europe, 2012
    • ITRPV, International Technology Roadmap for Photovoltaics, SEMI PV Group Europe, 2012.
  • 7
    • 0031998838 scopus 로고    scopus 로고
    • Electrical properties and recombination activity of copper, nickel and cobalt in silicon
    • A. Istratov and E. Weber, "Electrical properties and recombination activity of copper, nickel and cobalt in silicon", Applied Physics A: Materials Science &Processing, vol. 66(2), pp. 123-136, 1998.
    • (1998) Applied Physics A: Materials Science &Processing , vol.66 , Issue.2 , pp. 123-136
    • Istratov, A.1    Weber, E.2
  • 8
    • 1942436339 scopus 로고    scopus 로고
    • Assessing the reliability and degradation of photovoltaic module performance parameters
    • E.L. Meyer and E.E. van Dyk "Assessing the reliability and degradation of photovoltaic module performance parameters", IEEE Transactions on Reliability, vol. 53(1), pp. 83-92, 2004.
    • (2004) IEEE Transactions on Reliability , vol.53 , Issue.1 , pp. 83-92
    • Meyer, E.L.1    Van Dyk, E.E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.