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Volumn 556, Issue , 2014, Pages 381-384

Observation of feature ripening inversion effect at the percolation threshold for the growth of thin silver films

Author keywords

Growth behavior; In situ; Percolation; Silver; Thin metal films

Indexed keywords

DEPOSITION; METALLIC FILMS; PERCOLATION (SOLID STATE); SCANNING ELECTRON MICROSCOPY; SHEET RESISTANCE; SILVER;

EID: 84896400411     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2014.01.067     Document Type: Article
Times cited : (13)

References (17)
  • 1
    • 84896403836 scopus 로고    scopus 로고
    • http://www.heliatek.com/wp-content/uploads/2013/01/130116-PR-Heliatek- achieves-record-cell-effiency-for-OPV.pdf 2013
    • (2013)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.