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Volumn 556, Issue , 2014, Pages 381-384
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Observation of feature ripening inversion effect at the percolation threshold for the growth of thin silver films
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Author keywords
Growth behavior; In situ; Percolation; Silver; Thin metal films
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Indexed keywords
DEPOSITION;
METALLIC FILMS;
PERCOLATION (SOLID STATE);
SCANNING ELECTRON MICROSCOPY;
SHEET RESISTANCE;
SILVER;
GROWTH BEHAVIOR;
IN-SITU;
IN-SITU MONITORING;
INVERSION EFFECTS;
PERCOLATION BEHAVIOR;
PERCOLATION THRESHOLDS;
SCANNING ELECTRON MICROGRAPHS;
THIN METAL FILMS;
SOLVENTS;
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EID: 84896400411
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2014.01.067 Document Type: Article |
Times cited : (13)
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References (17)
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