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Journal of Electron Spectroscopy and Related Phenomena

Volumn 191, Issue , 2013, Pages 20-26

Core level X-ray photoelectron spectroscopy study of exchange coupled Fe/NiO bilayer interfaced with Si substrate (Fe/NiO-nSi structure)

(3) Srivastava, Neelabh a Shripathi, T b Srivastava, P C a

a BANARAS HINDU UNIVERSITY (India)

b UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH (India)

Author keywords

Chemical interactions; Interfacial intermixing; Irradiation; Surface states; XPS

Indexed keywords

EID: 84894901446 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/j.elspec.2013.09.003 Document Type: Article

Times cited : (15)

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