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Volumn 191, Issue , 2013, Pages 20-26

Core level X-ray photoelectron spectroscopy study of exchange coupled Fe/NiO bilayer interfaced with Si substrate (Fe/NiO-nSi structure)

Author keywords

Chemical interactions; Interfacial intermixing; Irradiation; Surface states; XPS

Indexed keywords


EID: 84894901446     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2013.09.003     Document Type: Article
Times cited : (15)

References (27)
  • 16
    • 84894901558 scopus 로고    scopus 로고
    • http://www.phy.cuhk.edu.hk/∼surface/XPSPEAK/4.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.