|
Volumn 64, Issue 2, 2014, Pages 212-216
|
FEL simulation of the 0.1-nm Hard X-ray from the PAL-XFEL
|
Author keywords
Free electron laser; Micro bunching; Self amplified spontaneous emission; Undulator; Wakefield
|
Indexed keywords
|
EID: 84894098716
PISSN: 03744884
EISSN: 19768524
Source Type: Journal
DOI: 10.3938/jkps.64.212 Document Type: Article |
Times cited : (3)
|
References (16)
|