메뉴 건너뛰기




Volumn 64, Issue 2, 2014, Pages 212-216

FEL simulation of the 0.1-nm Hard X-ray from the PAL-XFEL

Author keywords

Free electron laser; Micro bunching; Self amplified spontaneous emission; Undulator; Wakefield

Indexed keywords


EID: 84894098716     PISSN: 03744884     EISSN: 19768524     Source Type: Journal    
DOI: 10.3938/jkps.64.212     Document Type: Article
Times cited : (3)

References (16)
  • 12
    • 4143053988 scopus 로고    scopus 로고
    • M. Borland, APS LS-287 (2000). http://www. aps. anl.-gov/Science/Publications/lsnotes/.
    • (2000) APS LS-287
    • Borland, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.