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Thin Solid Films

Volumn 553, Issue , 2014, Pages 127-131

Electrical conductivity and Raman characterization of V2O 5 grown by sol-gel technique inside nanoscale pores

(4) Castriota, M a Cazzanelli, E a Fasanella, A a Teeters, D b

a UNIVERSITY OF CALABRIA (Italy)

b UNIVERSITY OF TULSA (United States)

Author keywords

A.C. impedance spectroscopy; Nanostructures; Raman spectroscopy; Vanadium pentoxide xerogel

Indexed keywords

EID: 84894098617 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2013.11.126 Document Type: Conference Paper

Times cited : (23)

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