The effect of thermal annealing processes on structural and photoluminescence of zinc oxide thin film

Journal of Nanomaterials

Volumn 2013, Issue , 2013, Pages

  Chin, Huai Shan ^a   Chao, Long Sun ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

GREEN LIGHT EMISSION; HIGH TEMPERATURE FURNACES; INTERNAL STRUCTURE; LUMINESCENCE PROPERTIES; PHOTOLUMINESCENCE MEASUREMENTS; RADIO FREQUENCY SPUTTERING; THERMAL ANNEALING PROCESS; ZINC OXIDE THIN FILMS;

DEPOSITION; HOUSING; LIGHT EMISSION; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

ANNEALING;

EID: 84893825385     PISSN: 16874110     EISSN: 16874129     Source Type: Journal    
DOI: 10.1155/2013/424953     Document Type: Article

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